Luca Abeni,
Scuola Superiore Sant'Anna, Italy
Claudio Ardagna,
Universita degli Studi di Milano, Italy
Luiz F. Bittencourt,
IC/UNICAMP, Brazil
Andrey Brito,
Universidade Federal de Campina Grande, Brazil
Claudia Canali,
University of Modena and Reggio Emilia, Italy
Manuel Capel-Tuñón,
University of Granada, Spain
Eddy Caron,
École Normale Supérieure de Lyon, France
John Cartlidge,
University of Bristol, United Kingdom
Anis Charfi,
Carnegie Mellon University, Qatar
Richard Chbeir,
Université de Pau et des Pays de l'Adour (UPPA), France
Thierry Coupaye,
Orange, France
Sabrina De Capitani di Vimercati,
Università degli Studi di Milano, Italy
Frédéric Desprez,
Antenne Inria Giant, Minatec Campus, France
Vincent Emeakaroha,
Cork Institute of Technology, Ireland
Abdelkarim Erradi,
Qatar University, Qatar
Massimo Ficco,
University of Campania Luigi Vanvitelli, Italy
Somchart Fugkeaw,
Thammasat University, Thailand
Antonio García Loureiro,
University of Santiago de Compostela, Spain
Francisco García-Sánchez,
University of Murcia, Spain
Sukhpal Gill,
Queen Many University of London, Australia
Lee Gillam,
University of Surrey, United Kingdom
Nils Gruschka,
University of Oslo, Norway
Franz Hauck,
Ulm University, Germany
Ilian Ilkov,
IBM Nederland B.V., Netherlands
Martin Jaatun,
University of Stavanger, Norway
Meiko Jensen,
Kiel University of Applied Sciences, Germany
Carlos Juiz,
Universitat de les Illes Balears, Spain
Péter Kacsuk,
MTA SZTAKI, Hungary
Attila Kertesz,
University of Szeged, Hungary
Hamzeh Khazaei,
York University, Canada
George Kousiouris,
Harokopio University of Athens, Greece
József Kovács,
MTA SZTAKI, Hungary
Nane Kratzke,
Lübeck University of Applied Sciences, Germany
Adam Krechowicz,
Kielce University of Technology, Poland
Riccardo Lancellotti,
University of Modena and Reggio Emilia, Italy
Frank Leymann,
University of Stuttgart, Germany
Shijun Liu,
School of Computer Science and Technology, Shandong University, China
Xiaodong Liu,
Edinburgh Napier University, United Kingdom
Francesco Longo,
Università degli Studi di Messina, Italy
Joseph Loyall,
BBN Technologies, United States
Paulo Maciel,
Universidade Federal de Pernambuco, Brazil
Ioannis Mavridis,
University of Macedonia, Greece
Kamran Munir,
University of the West of England, Bristol, United Kingdom
Hidemoto Nakada,
National Institute of Advanced Industrial Science and Technology (AIST), Japan
Philippe Navaux,
UFRGS - Federal University of Rio Grande Do Sul, Brazil
Stephan Olariu,
Old Dominion University, United States
Michael Palis,
Rutgers University, United States
Thanasis Papaioannou,
AUEB Research Center, Greece
David Paul,
The University of New England, Australia
Dana Petcu,
West University of Timisoara, Romania
Agostino Poggi,
University of Parma, Italy
Antonio Puliafito,
Università degli Studi di Messina, Italy
Arcot Rajasekar,
University of North Carolina at Chapel Hill, United States
Massimiliano Rak,
University of Campania Luigi Vanvitelli, Italy
Manuel Ramos-Cabrer,
University of Vigo, Spain
Christoph Reich,
Furtwangen University, Germany
António Rosado da Cruz,
Instituto Politécnico de Viana do Castelo, Portugal
Patrizia Scandurra,
University of Bergamo, Italy
Erich Schikuta,
Universität Wien, Austria
Alan Sill,
Texas Tech University, United States
Richard Sinnott,
University of Melbourne, Australia
Frank Siqueira,
Federal University of Santa Catarina, Brazil
Ellis Solaiman,
Newcastle University, United Kingdom
Jacopo Soldani,
Università di Pisa, Italy
Josef Spillner,
Zurich University of Applied Sciences, Switzerland
Marc St-Hilaire,
Carleton University, Canada
Yasuyuki Tahara,
The University of Electro-Communications, Japan
Gilbert Tekli,
Nobatek, France, Lebanon
Guy Tel-Zur,
Ben-Gurion University of the Negev (BGU), Israel
Orazio Tomarchio,
University of Catania, Italy
Slim Trabelsi,
SAP, France
Tullio Vardanega,
University of Padua, Italy
Yiannis Verginadis,
ICCS, National Technical University of Athens, Greece
Michael Zapf,
Georg Simon Ohm University of Applied Sciences, Germany
Chrysostomos Zeginis,
ICS-FORTH, Greece
(list not yet complete)